تصفح حسب المؤلف "Ozden, Burcu"
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Study of device instability of bottom-gate ZnO transistors with sol-gel derived channel layers
Yapabandara, Kosala; Mirkhani, Vahid; Sultan, Muhammad Shehzad; Ozden, Burcu; Khanal, Min P.; Parka, Minseo... more authors ... less authors ( American Institute of Physics Inc. , 2017 , Article)In this paper, the authors report the device instability of solution based ZnO thin film transistors by studying the time-evolution of electrical characteristics during electrical stressing and subsequent relaxation. A ... -
Time-resolved photocurrent spectroscopic diagnostics of electrically active defects in AlGaN/GaN High Electron Mobility Transistor (HEMT) structure grown on Si wafers
Ozden, Burcu; Khanal, Min P; Mirkhani, Vahid; Yapabandara, Kosala; Yang, Chungman; Ko, Sangjong; Youn, Suhyeon; Hamilton, Michael C; Sk, Mobbassar Hassan; Ahyi, Ayayi Claude; Park, Minseo... more authors ... less authors ( American Scientific Publishers , 2016 , Article)Time-resolved photocurrent (TRPC) spectroscopy with a variable-wavelength sub-bandgap light excitation was used to study the dynamics of the decaying photocurrent generated in the heterostructures of the AlGaN/GaN high ...