• Bayesian framework for fault variable identification 

      Turkoz M.; Kim S.; Jeong Y.-S.; Jeong M.K.; Elsayed E.A.; ... more authors ( Taylor and Francis Inc. , 2019 , Article)
      In most manufacturing processes, identifying the faulty process variables that may lead to process changes is crucial for quality engineers and practitioners. There are several parametric procedures for identifying faulty ...
    • Distribution-Free Adaptive Step-Down Procedure for Fault Identification 

      Turkoz, Mehmet; Kim, Sangahn; Jeong, Young-Seon; Al-Khalifa, Khalifa N.; Hamouda, Abdel Magid ( Wiley , 2016 , Conference Paper)
      Identifying the faulty variables of the out-of-control signal in high-dimensional process is an important problem for quality control areas. Even though there have been several procedures for fault variable identifications, ...