Browsing Academic by Author "Bettayeb, Maamar"
Now showing items 1-2 of 2
Title | Author | Publication Date | Publisher | Type |
---|---|---|---|---|
Defect deconvolution using 3rd order statistics for Ultrasonic Nondestructive Testing | Qidwai, Uvais; Bettayeb, Maamar; Yamani, Ahmed | 2007 | IEEE | Conference Paper |
Defect Deconvolution using 4th Order Statistics for Ultrasonic Nondestructive Testing | Qidwai, Uvais; Bettayeb, Maamar; Yamani, Ahmed | 2007 | IEEE | Conference Paper |