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AuthorSiddiqui, Zainab
AuthorAbdel-Salam, Abdel-Salam G.
Available date2020-05-14T09:55:46Z
Publication Date2019
Publication NameQuality and Reliability Engineering International
ISSN7488017
URIhttp://dx.doi.org/10.1002/qre.2439
URIhttp://hdl.handle.net/10576/14878
AbstractProfile monitoring is a vast area of research underneath the statistical process monitoring (SPM). Several methods for univariate and multivariate process control are found in literature to monitor the profile data, including parametric, nonparametric, and some semiparametric methods. The main idea behind monitoring the linear profiles in mixed effects is to model the possible individual differences between similar set of profiles for future monitoring. In this paper, nonparametric and semiparametric approaches are proposed to model the profile data in a linear mixed effect setting by considering the residuals from a parametric model. A simulation study was carried out to compare the efficiency of the proposed methods. At first step, the residuals from a parametric linear mixed model are obtained. A nonparametric approach (NPR) is then used to model these residuals. Finally, a semiparametric method (MMRRPM) is proposed as a convex combination of the parametric (P) and nonparametric estimations based on the residuals (NPR) to model the profile data in mix effects. Two Hoteling's T 2 statistics were computed for each technique based on fitted values and the estimated random effects. The results show that the proposed methods are most effective to monitor the autocorrelated profile data compared with the state-of-the-art. - 2018 John Wiley & Sons, Ltd.
SponsorThis work was supported by Qatar University through the Internal Student Grant number (QUST?1?CAS?2018?1).
Languageen
PublisherJohn Wiley and Sons Ltd
Subjectmixed model
Subjectmodel misspecification
Subjectmodel robust regression
Subjectprofile monitoring
Subjectresidual
SubjectT 2 control chart
TitleA semiparametric profile monitoring via residuals
TypeArticle
Pagination959-977
Issue Number4
Volume Number35


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